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VLSI Test Principles and Architectures

VLSI Test Principles and Architectures Design for Testability

Paperback (07 Jul 2006)

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Publisher's Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. À Most up-to-date coverage of design for testability. À Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. À Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. À Lecture slides and exercise solutions for all chapters are now available. À Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Book information

ISBN: 9781493300860
Publisher: Morgan Kaufmann
Imprint: Morgan Kaufmann
Pub date:
Language: English
Number of pages: 808
Weight: -1g