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VLSI Test Principles and Architectures

VLSI Test Principles and Architectures Design for Testability - The Morgan Kaufmann Series in Systems on Silicon

Hardback (14 Aug 2006)

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Publisher's Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Book information

ISBN: 9780123705976
Publisher: Elsevier Science
Imprint: Morgan Kaufmann
Pub date:
DEWEY: 621.395
DEWEY edition: 22
Language: English
Number of pages: 777
Weight: 1806g
Height: 241mm
Width: 200mm
Spine width: 51mm