Publisher's Synopsis
Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests (1920) is a book written by Lewis M. Terman. This book provides a comprehensive guide to the Stanford revision of the Binet-Simon intelligence tests. The Binet-Simon intelligence tests were developed by Alfred Binet and Theodore Simon in the early 1900s and were designed to measure intelligence in children. The Stanford revision of the tests was developed by Terman in 1916 and was designed to improve upon the original tests. The book begins with an introduction to the history and purpose of the tests. It then provides a detailed description of each test, including the verbal and nonverbal tests, and the age ranges for each test. The book also includes instructions for administering and scoring the tests, as well as guidelines for interpreting the results. In addition to the detailed descriptions of the tests, the book also includes information on the use of the tests in clinical and educational settings. It provides guidance on how to use the tests to identify children who may need special education services, as well as how to use the tests to evaluate the effectiveness of educational interventions. Overall, Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests (1920) is a valuable resource for anyone interested in understanding and using intelligence tests to measure the cognitive abilities of children.This scarce antiquarian book is a facsimile reprint of the old original and may contain some imperfections such as library marks and notations. Because we believe this work is culturally important, we have made it available as part of our commitment for protecting, preserving, and promoting the world's literature in affordable, high quality, modern editions, that are true to their original work.
