Publisher's Synopsis
The Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests (1920) is a book written by Lewis M. Terman. The book is a guide to administering and interpreting the Stanford-Binet Intelligence Scale, which is a standardized test used to measure intelligence in children and adults. The book provides a condensed version of the test, including instructions for administering the test, scoring the results, and interpreting the scores. The book also includes a brief history of the development of the Binet-Simon Intelligence Tests, as well as a discussion of the importance of intelligence testing. This book is a valuable resource for educators, psychologists, and other professionals who work with individuals who may benefit from intelligence testing.This scarce antiquarian book is a facsimile reprint of the old original and may contain some imperfections such as library marks and notations. Because we believe this work is culturally important, we have made it available as part of our commitment for protecting, preserving, and promoting the world's literature in affordable, high quality, modern editions, that are true to their original work.
