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Anomalous X-Ray Scattering for Materials Characterization

Anomalous X-Ray Scattering for Materials Characterization Atomic-Scale Structure Determination - Springer Tracts in Modern Physics

Softcover reprint of the original 1st Edition 2002

Paperback (03 Oct 2013)

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Book information

ISBN: 9783662146378
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: Softcover reprint of the original 1st Edition 2002
Language: English
Number of pages: 214
Weight: 361g
Height: 235mm
Width: 155mm
Spine width: 12mm