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Anomalous X-Ray Scattering for Materials Characterization

Anomalous X-Ray Scattering for Materials Characterization Atomic-Scale Structure Determination - Springer Tracts in Modern Physics

2002

Hardback (11 Sep 2002)

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Publisher's Synopsis

Book information

ISBN: 9783540434436
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2002
DEWEY: 539.7222
DEWEY edition: 21
Language: English
Number of pages: 214
Weight: 1110g
Height: 234mm
Width: 156mm
Spine width: 14mm