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X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography 9-13 July 1990, San Diego, California - Proceedings / SPIE--the International Society for Optical Engineering

Book (01 Jan 1991)

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Book information

ISBN: 9780819404046
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.36
DEWEY edition: 20
Language: English
Number of pages: 579
Weight: -1g