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X Rays in Materials Analysis

X Rays in Materials Analysis Novel Applications and Recent Developments : 21-22 August 1986, San Diego, California - Proceedings of SPIE--the International Society for Optical Engineering

Paperback (01 Jan 1986)

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Book information

ISBN: 9780892527250
Publisher: SPIE--the International Society for Optical Engineering
Imprint: SPIE--the International Society for Optical Engineering
Pub date:
DEWEY: 620.1127
DEWEY edition: 19
Language: English
Number of pages: 156