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X-Ray and Ultraviolet Polarimetry

X-Ray and Ultraviolet Polarimetry 15-16 July 1993, San Diego, California - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (30 Jun 2006)

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Book information

ISBN: 9780819412591
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 522.65
DEWEY edition: 20
Language: English
Number of pages: 230
Weight: 612g
Height: 279mm
Width: 222mm
Spine width: 12mm