Biometrics
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Published 20 Nov 2018
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X-Ray Imaging II 21-22 August 1986, San Diego, California - Proceedings of SPIE--the International Society for Optical Engineering
Paperback (01 Jan 1986)
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Book information
| ISBN: | 9780892527267 |
| Publisher: | SPIE--the International Society for Optical Engineering |
| Imprint: | SPIE--the International Society for Optical Engineering |
| Pub date: | 01 Jan 1986 |
| DEWEY: | 621.3673 |
| DEWEY edition: | 19 |
| Language: | English |
| Number of pages: | 149 |
| Weight: | -1g |
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