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X-Ray Diffraction

X-Ray Diffraction From Basics to Nanostructure Determination

Paperback (01 Sep 2017) | Chinese

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Book information

ISBN: 9781975795610
Publisher: Createspace Independent Publishing Platform
Imprint: Createspace Independent Publishing Platform
Pub date:
Language: Chinese
Number of pages: 62
Weight: 0g
Height: 254mm
Width: 178mm
Spine width: 3mm