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X-Ray Diffraction at Elevated Temperatures

X-Ray Diffraction at Elevated Temperatures A Method for in Situ Process Analysis

Book (01 Jan 1993)

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Book information

ISBN: 9780895737458
Publisher: VCH
Imprint: VCH
Pub date:
DEWEY: 548.83
DEWEY edition: 20
Language: English
Number of pages: 268