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X-Ray Diffraction at Elevated Temperatures

X-Ray Diffraction at Elevated Temperatures A Method for In Situ Process Analysis

Hardback (26 Feb 1993)

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Publisher's Synopsis

In light of the growing importance and availability of intense x-ray sources and position-sensitive detectors, this book offers comprehensive treatment of the principles, instrumentation, and applications of x-ray diffraction at elevated temperatures.

About the Publisher

Wiley Blackwell

Wiley's Professional Development business creates products and services that help customers become more effective in the workplace and achieve career success. It brings to life the ideas and best practices of thought leaders in business, finance, accounting, workplace learning, management, leadership, technology, behavioral health, engineering/architecture, and education to serve these communities worldwide.

Book information

ISBN: 9780471187264
Publisher: John Wiley & Sons Inc
Imprint: Wiley Blackwell
Pub date:
Number of pages: 268
Weight: 567g
Height: 241mm
Width: 159mm
Spine width: 53mm