Delivery included to the United States

VLSI Testing

VLSI Testing Digital and Mixed Analogue/digital Techniques - IEE Circuits, Devices and Systems Series

Hardback (30 Jun 1998)

  • $196.62
Add to basket

Includes delivery to the United States

10+ copies available online - Usually dispatched within 7 days

Publisher's Synopsis

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategies should be part of every circuit and system designer's education. This book is a comprehensive introduction and reference for all aspects of IC testing. It includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing. In addition to detailed coverage of digital network testing, VLSI testing also considers in depth the growing area of testing analogue and mixed analogue/digital ICs, used particularly in signal processing.

Book information

ISBN: 9780852969014
Publisher: The Institution of Engineering and Technology
Imprint: Institution of Engineering and Technology
Pub date:
DEWEY: 621.3950287
DEWEY edition: 22
Language: English
Number of pages: 532
Weight: 1088g
Height: 234mm
Width: 156mm
Spine width: 38mm