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VLSI Test Symposium
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Book information
| ISBN: | 9780818670008 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 31 Jan 1996 |
| DEWEY: | 621.395 |
| Language: | English |
| Number of pages: | 226 |
| Weight: | -1g |
| Height: | 279mm |
| Width: | 215mm |
| Spine width: | 31mm |
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