Hardback (18 May 1990)
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As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
| ISBN: | 9780122341229 |
| Publisher: | Elsevier Science |
| Imprint: | Academic Press |
| Pub date: | 18 May 1990 |
| DEWEY: | 621.395 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 207 |
| Weight: | 450g |
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