VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers - Communications in Computer and Information Science

Anirban Sengupta (editor), Sudeb Dasgupta (editor), Virendra Singh (editor), Rohit Sharma (editor), Santosh Kumar Vishvakarma (editor)

Paperback (18 Aug 2019)

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Publisher's Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Book information

ISBN:	9789813297661
Publisher:	Springer Nature Singapore
Imprint:	Springer
Pub date:	18 Aug 2019
Language:	English
Number of pages:	775
Weight:	1089g
Height:	235mm
Width:	155mm
Spine width:	40mm