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Unified Methods for VLSI Simulation and Test Generation

Unified Methods for VLSI Simulation and Test Generation - The Springer International Series in Engineering and Computer Science

1989

Hardback (30 Jun 1989)

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Book information

ISBN: 9780792390251
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: 1989
DEWEY: 621.395
DEWEY edition: 19
Language: English
Number of pages: 148
Weight: 910g
Height: 234mm
Width: 156mm
Spine width: 11mm