Uncertainty Analysis for Nist Noise-Parameter Measurement

U S Department of Commerce

Paperback (21 Jan 2014)

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Publisher's Synopsis

Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.

Book information

ISBN:	9781494743970
Publisher:	Createspace Independent Publishing Platform
Imprint:	Createspace Independent Publishing Platform
Pub date:	21 Jan 2014
Language:	English
Number of pages:	36
Weight:	81g
Height:	254mm
Width:	178mm
Spine width:	2mm