Delivery included to the United States

Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2004, San Jose, CA, USA, March 9-

Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2004, San Jose, CA, USA, March 9-

Paperback (14 Jul 2004)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9780780383630
Publisher: IEEE Press/IEEE Service Ctr
Pub date:
Number of pages: 313 p.