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Tutorial Test Generation for VLSI Chips

Tutorial Test Generation for VLSI Chips

Book (31 Jul 1988)

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    Publisher's Synopsis

    Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pag

    Book information

    ISBN: 9780818687860
    Publisher: Computer Society Press
    Imprint: Computer Society Press
    Pub date:
    DEWEY: 621.3950287
    DEWEY edition: 20
    Language: English
    Number of pages: 401
    Weight: -1g
    Height: 285mm
    Width: 215mm
    Spine width: 25mm

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