Delivery included to the United States

Trap Level Spectroscopy in Amorphous Semiconductors

Trap Level Spectroscopy in Amorphous Semiconductors

Paperback (28 Jun 2010)

  • $181.59
Add to basket

Includes delivery to the United States

10+ copies available online - Usually dispatched within 7 days

Publisher's Synopsis

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

Book information

ISBN: 9780323165037
Publisher: Elsevier Science
Imprint: Elsevier
Pub date:
Language: English
Number of pages: 128
Weight: 250g
Height: 229mm
Width: 152mm
Spine width: 7mm