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Transient-Induced Latchup in CMOS Integrated Circuits

Transient-Induced Latchup in CMOS Integrated Circuits - Wiley - IEEE

Hardback (30 Jul 2009)

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Publisher's Synopsis

Latchup Prevention equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout.

About the Publisher

Wiley Blackwell

Wiley is a global provider of content-enabled solutions to improve outcomes in research, education and professional practice with online tools, journals, books, databases, reference works and laboratory protocols. With strengths in every major academic, scientific and professional field, and strong brands including Wiley Blackwell and Wiley VCH, Wiley proudly partners with over 800 prestigious societies representing two million members.

Book information

ISBN: 9780470824078
Publisher: Wiley-Blackwell
Imprint: Wiley Blackwell
Pub date:
DEWEY: 621.395
DEWEY edition: 22
Language: English
Number of pages: 249
Weight: 650g
Height: 244mm
Width: 168mm
Spine width: 21mm