Practical Skills in Forensic Sc...
Paperback
Published 01 Nov 2018
- $86.41
Trace Analysis and Technological Development Special and Contributed Papers Presented at an International Symposium Held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981)
Book (01 Jan 1983)
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Book information
| ISBN: | 9780470274620 |
| Publisher: | Wiley |
| Imprint: | Wiley |
| Pub date: | 01 Jan 1983 |
| DEWEY: | 543 |
| DEWEY edition: | 19 |
| Language: | English |
| Number of pages: | 407 |
| Weight: | -1g |
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