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ToF-SIMS

ToF-SIMS Surface Analysis by Mass Spectrometry

(31 Oct 2001)

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Publisher's Synopsis

ToF-SIMS is now regarded as a major technique for analysing the surface characteristics of solids. This volume presents an integrated overview of the technique and its practical applications in the field of materials technology.

Book information

ISBN: 9781901019032
Publisher: IM
Imprint: IM
Pub date:
DEWEY: 541.33
DEWEY edition: 21
Number of pages: 789
Weight: 1800g
Height: 255mm
Width: 175mm
Spine width: 45mm