2008
Hardback (26 Sep 2008)
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Here, contributions to the 18th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility are presented in full length. Chapters address topics in fields such as Automotive EMC, Measurement Techniques, EMC Protection, Computational Electromagnetics, Chip-Level EMC, EMC in Communications and more.
| ISBN: | 9783540687665 |
| Publisher: | Springer Berlin Heidelberg |
| Imprint: | Springer |
| Pub date: | 26 Sep 2008 |
| Edition: | 2008 |
| DEWEY: | 537.6 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 417 |
| Weight: | 822g |
| Height: | 235mm |
| Width: | 155mm |
| Spine width: | 20mm |
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