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Three-Dimensional Imaging, Optical Metrology, and Inspection V

Three-Dimensional Imaging, Optical Metrology, and Inspection V 19-20 September 1999, Boston, Massachusetts - SPIE Proceedings Series

Paperback (31 Dec 1999)

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Publisher's Synopsis

This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.

Book information

ISBN: 9780819434289
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 21
Language: English
Number of pages: 224
Weight: 544g
Height: 267mm
Width: 216mm
Spine width: 12mm