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Three-Dimensional Imaging, Optical Metrology, and Inspection IV

Three-Dimensional Imaging, Optical Metrology, and Inspection IV 2-3 November, 1998, Boston, Massachusetts - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (31 May 1999)

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Publisher's Synopsis

Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.

Book information

ISBN: 9780819429810
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 21
Language: English
Number of pages: 304
Weight: 748g
Height: 230mm
Width: 209mm
Spine width: 19mm