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Third International Workshop on Pattern Recognition

Third International Workshop on Pattern Recognition 26-28 May 2018, Jinan, China - Proceedings of SPIE

Paperback (30 Aug 2018)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9781510622685
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 006.4
DEWEY edition: 23/eng/20230216
Language: English
Number of pages: 420
Weight: -1g
Height: 279mm
Width: 216mm