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Third International Conference on the Economics of Design, Test, and Manufacturing

Third International Conference on the Economics of Design, Test, and Manufacturing Proceedings, May 16-17, 1994, Austin, Texas

Book (30 Sep 1995)

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Publisher's Synopsis

Focuses on economic analysis in the decision making and application of testing electronic circuits at all levels. The 21 papers, revised for publication, consider such facets as error modeling in a board test, synthesizing testable systolic arrays, manufacturing cost analysis for electronic packing, the need for highly integrated manufacturing test

Book information

ISBN: 9780818665950
Publisher: IEEE Computer Society Press
Imprint: IEEE Computer Society Press
Pub date:
Language: English
Number of pages: 163
Weight: -1g