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Third IEEE International Workshop on Electronic Design, Test, and Applications : Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia

Third IEEE International Workshop on Electronic Design, Test, and Applications : Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia

Book (01 Jan 2006)

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Book information

ISBN: 9780769525006
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 621.381
DEWEY edition: 22
Language: English
Number of pages: 521
Weight: -1g