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Theoretical Concepts of X-Ray Nanoscale Analysis

Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications - Springer Series in Materials Science

2014

Hardback (18 Sep 2013)

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Publisher's Synopsis

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Book information

ISBN: 9783642381768
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2014
DEWEY: 620.11015397222
DEWEY edition: 23
Language: English
Number of pages: 318
Weight: 664g
Height: 235mm
Width: 155mm
Spine width: 23mm