Publisher's Synopsis
""The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence"" is a book written by Lewis M. Terman that details the development and use of the Stanford-Binet Intelligence Scale. The book is a revision and extension of the original Binet-Simon Scale, which was created in France in the early 1900s to measure intelligence in children. Terman's revision and extension of the scale was based on research conducted with American children and included new tests and scoring methods. The book provides a comprehensive overview of the Stanford-Binet Intelligence Scale, including its history, administration, and interpretation. It also includes case studies of individuals who were tested using the scale and provides guidance on how to use the results to inform educational and clinical decisions. Overall, ""The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence"" is a seminal work in the field of intelligence testing and has had a significant impact on the development of intelligence testing in the United States and around the world.This scarce antiquarian book is a facsimile reprint of the old original and may contain some imperfections such as library marks and notations. Because we believe this work is culturally important, we have made it available as part of our commitment for protecting, preserving, and promoting the world's literature in affordable, high quality, modern editions, that are true to their original work.
