Book (15 Jun 2006)
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Seventeen contributions to the May 2002 conference (devoted to issues of electronic-based circuit and system testing) are presented here. Topics include silicon technology advances and implications on test, a test time reduction algorithm for test architecture design for core-based systems, modeling gate oxide short defects in CMOS minimum transist
| ISBN: | 9780769517155 |
| Publisher: | IEEE Computer Society |
| Imprint: | IEEE Computer Society |
| Pub date: | 15 Jun 2006 |
| DEWEY: | 621.381548 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 130 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 215mm |
| Spine width: | 6mm |
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