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The 10th International Conference on X-Ray Microscopy, Chicago, Illinois, USA, 15-20 August 2010

The 10th International Conference on X-Ray Microscopy, Chicago, Illinois, USA, 15-20 August 2010 - AIP Conference Proceedings

2011

Paperback (31 Oct 2011)

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Publisher's Synopsis

This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.

Book information

ISBN: 9780735409255
Publisher: American Institute of Physics
Imprint: American Institute of Physics
Pub date:
Edition: 2011
DEWEY: 502.82
DEWEY edition: 23
Language: English
Number of pages: 473
Weight: 1066g
Height: 277mm
Width: 213mm
Spine width: 25mm