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Testing and Reliable Design of CMOS Circuits

Testing and Reliable Design of CMOS Circuits - The Springer International Series in Engineering and Computer Science

1990

Hardback (31 Dec 1989)

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Publisher's Synopsis

Book information

ISBN: 9780792390565
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: 1990
DEWEY: 621.38173
DEWEY edition: 18
Language: English
Number of pages: 231
Weight: 542g
Height: 234mm
Width: 156mm
Spine width: 15mm