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Testing, Reliability, and Application of Micro- And Nano-Material Systems

Testing, Reliability, and Application of Micro- And Nano-Material Systems 3-5 March, 2003, San Diego, California, USA - SPIE Proceedings Series

Book (31 Jul 2003)

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Book information

ISBN: 9780819448507
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.36
DEWEY edition: 22
Language: English
Number of pages: 276
Weight: 680g
Height: 266mm
Width: 209mm
Spine width: 19mm