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Testing, Reliability, and Application of Micro- And Nano-Material Systems IV

Testing, Reliability, and Application of Micro- And Nano-Material Systems IV 28 February-2 March 2006, San Diego, California, USA - Proceedings of SPIE

Paperback (30 Jan 2008)

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    Publisher's Synopsis

    Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

    Book information

    ISBN: 9780819462282
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    Language: English
    Weight: -1g

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