Paperback (30 Nov 1997)
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The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them. This text covers the 1996 conference.
| ISBN: | 9780780342095 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 30 Nov 1997 |
| DEWEY: | 621.395 |
| Language: | English |
| Number of pages: | 1000 |
| Weight: | -1g |
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