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Surface and Interface Characterization by Electron Optical Methods

Surface and Interface Characterization by Electron Optical Methods - Nato ASI Subseries B

1988

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Publisher's Synopsis

Book information

ISBN: 9781461595397
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: 1988
Language: English
Number of pages: 319
Weight: 575g
Height: 244mm
Width: 170mm
Spine width: 18mm