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Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002 : Proceedings - Lecture Notes in Computer Science.

2002

Paperback (24 Jul 2002)

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Publisher's Synopsis

Book information

ISBN: 9783540440116
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2002
DEWEY: 006.4
DEWEY edition: 21
Language: English
Number of pages: 863
Weight: 1308g
Height: 234mm
Width: 156mm
Spine width: 44mm