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Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : Proceedings - Lecture Notes in Computer Science

2006

Paperback (03 Aug 2006)

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Publisher's Synopsis

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006.

Book information

ISBN: 9783540372363
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2006
DEWEY: 006.4
DEWEY edition: 22
Language: English
Number of pages: 939
Weight: 1431g
Height: 234mm
Width: 156mm
Spine width: 48mm