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Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022, Proceedings - Lecture Notes in Computer Science

Paperback (02 Jan 2023)

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Publisher's Synopsis

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022.

The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.

Book information

ISBN: 9783031230271
Publisher: Springer International Publishing
Imprint: Springer
Pub date:
DEWEY: 006.4
DEWEY edition: 23
Language: English
Number of pages: 324
Weight: 476g
Height: 235mm
Width: 155mm
Spine width: 18mm