Delivery included to the United States

Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures

Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Symposium Held December 2-6, 2002, Boston, Massachusetts, U.S.A - Materials Research Society Symposium Proceedings

Hardback (27 Mar 2003)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Publisher's Synopsis

A primary driver of progress in nanoscience and technology is the continuing advances in the ability to measure structure, and particularly properties, at spatially localized scales. From the point of view of characterization, it is worth mentioning advances in the interpretation of processes in semiconductors, the ability to observe and manipulate metal, carbon and silicon nanowires and nanodots, and studies in molecular self-assembly. The papers in this book fall into two categories - those addressing classes of characterization techniques that emphasize how the combination of theoretical, experimental, and instrumentational developments lead to new capabilities in nanoscale characterization, and those focused on the use of various spatially localized approaches on a single phenomenon or materials issue. Topics include: characterization with electron optics; novel measurements of nanoscale properties; size-dependent behavior of nanoparticles; biological systems at the nanoscale; processing and properties of nanowires and heterostructures; and local phenomena in materials and microstructures.

Book information

ISBN: 9781558996755
Publisher: Materials Research Society
Imprint: Materials Research Society
Pub date:
DEWEY: 620.5
DEWEY edition: 22
Language: English
Number of pages: 425
Weight: 682g
Height: 234mm
Width: 155mm
Spine width: 28mm