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Software Patterns, Knowledge Maps, and Domain Analysis

Software Patterns, Knowledge Maps, and Domain Analysis

Hardback (03 Dec 2014)

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Publisher's Synopsis

Book information

ISBN: 9781466571433
Publisher: CRC Press
Imprint: Auerbach
Pub date:
DEWEY: 658.4038
DEWEY edition: 23
Language: English
Number of pages: 422
Weight: 1016g
Height: 259mm
Width: 185mm
Spine width: 31mm