Publisher's Synopsis
Excerpt from Small Aperture Analysis of the Dual Tem Cell and an Investigation of Test Object Scattering in a Single Tem Cell
Small aperture theory is used to investigate the dual tem cell. Analyzing coupling through an empty versus a loaded aperture leads to a model of dual tem cell shielding effectiveness measurements. Small obstacle scattering yields results for both the field perturbation and the change in a cell's transmission line characteristics due to the presence of a test object in a tem cell. In each case, theoretical values are compared to experimental data. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.