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Sixth International Workshop on Microprocessor Test and Verification

Sixth International Workshop on Microprocessor Test and Verification Common Challenges and Solutions : MTV 2005 : Proceedings : Austin, Texas, 3-4 November, 2005

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Book information

ISBN: 9780769526270
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 004.16
DEWEY edition: 22
Language: English
Number of pages: 143