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Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering

Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering 9-15 June 2003, St. Petersburg, Russia - SPIE Proceedings Series

Paperback (30 Apr 2004)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819453235
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 620.1127
DEWEY edition: 22
Language: English
Number of pages: 306
Weight: 748g
Height: 266mm
Width: 209mm
Spine width: 19mm