Hardback (18 Jul 1990)
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This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods.;This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
| ISBN: | 9780471511045 |
| Publisher: | Wiley |
| Imprint: | Wiley Blackwell |
| Pub date: | 18 Jul 1990 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 599 |
| Weight: | 964g |
| Height: | 63mm |
| Width: | 44mm |
| Spine width: | 30mm |
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