Hardback (20 Sep 1994)
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This volume contains the proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry (SIMS IX), held in Yokohama, Japan, in November 1993. The contributors explore a range of research issues, from environmental problems to depth profiling and semiconductors.
| ISBN: | 9780471942184 |
| Publisher: | Wiley Blackwell |
| Imprint: | John Wiley & Sons, Inc. |
| Pub date: | 20 Sep 1994 |
| Number of pages: | 1008 |
| Weight: | 1660g |
| Height: | 278mm |
| Width: | 153mm |
| Spine width: | 51mm |
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